SEM & EDX Analysis
Scanning Electron Microscopy is one of the most popular and widely used metallurgical techniques to carry out analysis of a sample’s microstructure and surface topography.
SEM and EDX tests are routine, non-destructive methods of analysis to help determine the elemental composition of a sample or material.
SEM microscopy produces high resolution SEM images by scanning the surface of the sample with a focused electron beam, rather than the usual optical means. This allows for imaging at very high magnifications, typically from about 10 to 5,000 times, with a clarity previously not possible.