SEM and EDX Analysis
An SEM, or scanning electron microscope, is a type of microscope that produces images of a sample by scanning the surface with a focused beam of electrons rather than the usual optical means. This allows for imaging at very high magnifications, typically from about 10 to 500,000 times, with a clarity previously not possible.
Typical features of SEM analysis that can be viewed are fracture faces of failed parts, or surface conditions of components.Enquire Today
EDX, also variously known as EDAX or EDS, EDX microanalysis is the targeted analysis of a feature observed on the scanning electron microscope. The method is limited in that it is semi-quantitative, cannot identify organic matter and there are a few elements that it cannot detect, even if present, but if you have an unknown material (for instance, contamination on a component or a fracture face) EDX analysis can be used to identify its approximate chemical make-up.
SEM or EDX can be used on a failed component that’s made from metal. From domestic copper pipework, fastener systems (or nuts and bolts), high-tension wires, chains, cast housings, even artificial hip implants; in truth the scope is limited only by the ability of metal to be used in an application.
Should a part fail, Manufacturers and consumers need to know how and why. A failure analysis that includes SEM/EDX can provide answers to why a part has failed. Steps can then be taken to help avoid the same problem & issues in future and therefore reduce costs & expenses.
Material Failure Investigations* consist of individual tests that include a visual examination, SEM (and EDX if required), metallography, chemical analysis, hardness test and tensile tests, subject to sufficient sample material being provided.
If you want to know more about SEM Microscopy, what's going on in our metallurgy laboratory or have more questions, contact a member of the team today.